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    • 7TH SPANISH METROLOGY CONGRESS (CEM)
     

    06th October 2022





    Our colleagues Javier Verdugo, Moisés Rodríguez, Jesus Ovideo y Mario Piattini has participated in the 7th Spanish Metrology Congress (CEM) with the presentation of the poster "Software Quality Assessment with ISO/IEC 25000".

    The 7th Spanish Metrology Congress, promoted by the Spanish Metrology Center in collaboration with the Junta de Castilla y León, took place at the Congress and Exhibition Center Lienzo Norte in Ávila on September 27th, 28th and 29th, 2022.

    The main objective of CEM is to generate meeting spaces and promote the exchange of scientific and technical information in the field of measurements and instrumentation, as well as the intensification of cooperation between experts from institutions, industries, universities and administrations.

    With the incorporation of new technologies in metrology, information technologies are increasingly present in the congress, being the digitization, together with sustainability, an element that was focused on in the presentations of the congress, which has had as motto of this 7th edition "Metrology in the era of digitization and sustainability".

    In this context, AQCLab has exhibited the poster "Software Quality Assessment with ISO/IEC 25000", which presents the testing methods carried out as an accredited laboratory for the evaluation of software and data quality.



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